Measurement Instruments

Developing a current measurement module that is fast, that has a high resolution and provides highly repeatable measurement results is not an easy nor trivial task.

A quiescent (supply or ground) current (IDDQ, ICCQ, ISSQ) measurement module should be able to  handle the (large) transient currents - with potential peak values of several hundreds of milli-amps, several amps or even tens of amps, which occur when the circuit is switching from one state to another - as well as accurately measuring the quiescent currents with normal values in the nA-µA- mA range, all without affecting at any time the operation and the operation conditions of the circuit under test.

IXXQ measurement modules can be realized either as on-chip measurement / observation circuitry (monitor) - in that case they are integrated together with the circuit to test and are called Built-in  Current Monitors (BIC) - or they can be realized as a dedicated measurement module, which eventually can be mounted on the interface board that connects the device under test with the test equipment - in such a case these circuits are called Off-Chip Current Monitors (OCM) and they can be realized using discrete components or as an integrated circuit themselves - or they can be can be realized as an option to an ATE machine.

Ridgetop Europe is committed to provide the best in class Q-Star current measurement products and solutions, addressing the varies aspects of current measurements and supporting both quiescent as well as dynamic current measurement and current measurement based test strategies. The Q-Star add-on solutions typically can make measurements 100 to 1000 times faster than embedded ATE solutions, are able to drive high capacitive loads and have a measurement resolution / repeatability which is typically an order of magnitude better than the embedded ATE measurement solutions. These characteristics support the use and application of current testing for an efficient and reliable screening of devices, even in the presence of large background currents.

BicMon

built-in current instrument

Motorola_LB_detail_Medium
mvc-004f_Medium

interface board application modules

 

What´s New

Seeking Your input to the 2019 Ixxx Survey

Click Here to join the 2019 edition of the Survey and get valuable insights in todays application of IDDQ, ISSQ, IDDT test in return

Meet us at ITC'2019

When Cost reduction, Test and Data quality are Keys
When Reliability is of Concern
When Quality of Engineering means Value
Learn about the rewards of our innovative solutions

 International Test Conference
12 - 14 November 2019
Washington DC, USA
booth 310

Get instant access to ideas and inspiration on IDDQ & IDDT
 

 

Copyright (c) Ridgetop Europe nv - All rights reserved                                                             | Privacy Policy | Terms of Use | Legal Notes |