Testimonials

ST-Microelectronics
Compared with the traditional approach we can reach a very good coverage, get more information, have a better precision in electrical measures together with a reduction of 10 times in the test time when using the Q-Star Test solution.
-- Luca Buratti, ST-Microelectronics

Sharp Microelectronics USA
A die-to-die & test set-up independent DSM strategy based on Current Ratios was developed & successfully implemented in a production environment, furthermore the production quality was improved significantly. This was made possible only through the use of an advanced Q-Star Test IDDQ monitor.
-- Richard Ackerman, Senior Test Engineer, SMA

Freescale Semiconductor
Making use of Q-Star Tests QD-1020 product allows us to reduce test costs whilst meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundreds of IDDQ strobe points, as well as offering us improved IDDQ data quality
-- David Prystasz, Product Engineering Test team leader, Freescale Semiconducor

ROOD Technology
Making use of Q-Star Tests QD-1010Lite product allows us to reduce test costs whilst meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundreds of IDDQ strobe points, as well as offering us improved IDDQ data quality
-- Dieter Schreiber, Marketing & Sales Manager, Rood Technology

Dialog Semiconductor
Making use of Q-Star Tests QD-1011 product allows us to reduce test costs significantly compared to conventional IDDQ testing, whilst meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundreds of IDDQ strobe points, as well as offering us improved IDDQ data quality
-- Markus Schmid, Manager Test Engineering Group, Dialog Semiconductor

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